Computational Metrology

Dual-wavelength Fourier Ptychographic Topography
Yi Shen, Tongyu Li, Hao Wang, Jinyong Kim, Hojun Lee, Wookrae Kim, Jonghyeok Park, Junho Shin, Seungbeom Park and Lei Tian
IEEE Transactions on Computational Imaging 2026.

Transfer-function approach to substrate-enhanced diffraction tomography
Tongyu Li, Yi Shen, Dashan Dong, Danchen Jia, Jianpeng Ao, Ji-Xin Cheng, and Lei Tian
Optica, 2026.

Reflection-mode Multi-slice Fourier Ptychographic Tomography
J Zhu, T Li, H Wang, Y Shen, G Hu, L Tian
IEEE Transactions on Computational Imaging, 2026

Reflection-mode diffraction tomography of multiple-scattering samples on a reflective substrate from intensity images
Tongyu Li, Jiabei Zhu, Yi Shen, and Lei Tian
Optica Vol. 12, Issue 3, pp. 406-417 (2025).

Fourier ptychographic topography
H. Wang, J. Zhu, J. Sung, G. Hu, J. Greene, Y. Li, S. Park, W. Kim, M. Lee, Y. Yang, L. Tian
Optics Express 31, pp. 11007-11018 (2023)
⭑ Open-Source Dataset