{"id":68,"date":"2015-08-16T22:11:57","date_gmt":"2015-08-17T02:11:57","guid":{"rendered":"https:\/\/sites.bu.edu\/yuweifan\/?page_id=68"},"modified":"2017-12-16T11:48:11","modified_gmt":"2017-12-16T16:48:11","slug":"instrument-specifications","status":"publish","type":"page","link":"https:\/\/sites.bu.edu\/yuweifan\/instrument\/instrument-specifications\/","title":{"rendered":"Instrument Specifications"},"content":{"rendered":"<h2><span style=\"color: #3366ff;\">Specifications of major testing instruments<\/span><\/h2>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>Field Emission Scanning Electron Microscope (FESEM) Hitachi SU6600<br \/>\n<strong>Manufacturer:<\/strong> Hitachi High Tech, Japan, and Oxford Instrument, UK<br \/>\n<strong>Resolution check report:<\/strong>[4\/21\/2015] 6.8nm at 10kV [5\/13\/2015] 4.6nm at 15kV.<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>Universal Testing Machine Instron 5566A<br \/>\n<strong>Manufacturer:<\/strong> Instron, Norwood, MAElectromechanical load frames are designed to apply a load to a test specimen via the moving crosshead.\u00a0Software version: Bluehill 3,0<br \/>\nTension, Compression, Tension Creep Relaxation, Compression Creep Relaxation, Tension Profile, Compression Profile, Peel\/Tear\/Friction, Flexure, Metals (Yield), Flexure Creep Relaxation<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName: <\/strong>Pneumatic Cyclic Loading machine (Fatigue machine)<br \/>\n<strong>Manufacturer:<\/strong> Pober Industries Co., Waban, MAPneumatically driven, 8 single unit medium (\u00d77.86), 2 large five unit assembly (\u00d7 21.84), 2 medium five unit assembly (\u00d77.86) and 2 X-small five unit assembly (\u00d7 1.364).<br \/>\nCyclic frequency: 1Hz<br \/>\nLoading capacity: 40-2000N<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>Gloss meter, Novo-curve<br \/>\n<strong>Manufacturer:<\/strong> Rhopoint Instruments, UKGloss is measured by shining a known amount of light at a surface and quantifying the reflectance. The angle of the light and the method by which the reflectance is measured are determined by the surface.<br \/>\nNovo-Curve is designed to measure gloss index for curved surface like teeth, pens, spoons, bottles, jewelry, etc. It follows the standard of ASTM D 523 \/ D 2457. It may be applied to study dental materials, such as surface polishability of composite, porcelain glazing, light reflectance and etc.<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>Polishing Machine, Ecomet 250\/Automet 250<br \/>\n<strong>Manufacturer:<\/strong> Buehler Ltd, Lake Bluff ILMaterials surface polishing.<br \/>\nManual or automatic polishing Force 1-10 lbs [5-45N].<strong>Name\/Model: <\/strong>Blade cutting machine, IsoMet\u2122 5000 Linear Precision Saw<\/p>\n<p class=\"equipment_profile\"><strong>Manufacturer:<\/strong> Buehler Ltd, Lake Bluff ILAutomatic section materials, plastic, resin, ceramic block, metal, tooth, etc.<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>Microhardness Tester, MicroMet\u2122 2003<br \/>\n<strong>Manufacturer:<\/strong> Buehler Ltd, Lake Bluff ILKnoop and Vickers hardness testing.<br \/>\nIndentation fracture toughness.<br \/>\nOne indenter turret.<br \/>\nTwo optical lenses: 40\u00d7, 10\u00d7.<br \/>\nLoad: 10, 25, 50, 100, 200, 300, 500, 1000g.<\/p>\n<p><strong>Name\/Model: <\/strong>Optical Microscope, IVS FSF Metallurgical<\/p>\n<p><strong>Manufacturer:<\/strong> LeicaBright field imaging. Dark field imaging. Polarized imaging.<\/p>\n<p class=\"equipment_profile\">CCD Camera and Video micrometer (5 micrometer res.)<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>High-temperature sintering furnace, Zircar Hotspot 110<br \/>\n<strong>Manufacturer:<\/strong> Zicar Zirconia Inc.programmable atmospheric high-temperature sintering furnace.<br \/>\nHigh-heat firing chamber (maximium:1600<sup>o<\/sup>C)<br \/>\nFour Molybdenum Disilicide Heating Elements<br \/>\nProgrammable controller. Hold two programs of up to 8 segments.<\/p>\n<p class=\"equipment_profile\"><strong><br \/>\nName\/Model: <\/strong>High-temperature sintering furnace, VITA\u00ae Zyrcomat T<br \/>\n<strong>Manufacturer:<\/strong> Vita VidentA programmable atmospheric high-temperature sintering furnace.<br \/>\nHigh-heat firing chamber (rated 1600<sup>o<\/sup>C)<br \/>\n5 molybdenum elements for uniform heat distribution<br \/>\nProcessing capabilities of 75 + plus\/single\/mixed unit restorations (Stacked)<br \/>\nDuration of the program cycle including cooling down to 400 \u00b0C for standard zirconia sintering: approx. 5 h.<\/p>\n<p class=\"equipment_profile\"><strong>Name\/Model: <\/strong>High-temperature sintering furnace, VITA\u00ae Zyrcomat<\/p>\n<p class=\"equipment_profile\"><strong>Manufacturer:<\/strong> Vita VidentAtmospheric high-temperature sintering furnace with default program for sintering firing VITA In-Ceram\u00ae YZ CUBES for CEREC\u00ae .<br \/>\nMolybdenum disilicide elements for uniform heat distribution<br \/>\n230V, 1500W<br \/>\nProcessing capabilities of 75 + plus\/single\/mixed unit restorations (Stacked)<br \/>\nDuration of the program cycle including cooling down to 200 \u00b0C for standard zirconia sintering: approx. 7.5 h.<\/p>\n<p class=\"equipment_profile\"><strong>Name\/Model: <\/strong>Xrite Ci7600 Benchtop Spectrophotometer<\/p>\n<p class=\"equipment_profile\"><strong>Manufacturer:<\/strong> X-riteComputer controlled by software through USB interface. Wavenumber range 750 -360 nm, interval 10 nm. Spectrum capability. Apertures selection: Small, Medium and Large size. Illumination: Xenon flash light source, CIE D65 calibrated.<br \/>\nReflectance mode and transmission mode. Export measurement data as MS Excel.<br \/>\n<strong>Application:<\/strong> Color measurement (L*a*b*);<br \/>\nContrast ratio (CR); Color difference (DE*);<br \/>\nTransparent parameter (TP)<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Specifications of major testing instruments Name\/Model: Field Emission Scanning Electron Microscope (FESEM) Hitachi SU6600 Manufacturer: Hitachi High Tech, Japan, and Oxford Instrument, UK Resolution check report:[4\/21\/2015] 6.8nm at 10kV [5\/13\/2015] 4.6nm at 15kV. Name\/Model: Universal Testing Machine Instron 5566A Manufacturer: Instron, Norwood, MAElectromechanical load frames are designed to apply a load to a test specimen [&hellip;]<\/p>\n","protected":false},"author":10461,"featured_media":0,"parent":24,"menu_order":2,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/pages\/68"}],"collection":[{"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/users\/10461"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/comments?post=68"}],"version-history":[{"count":5,"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/pages\/68\/revisions"}],"predecessor-version":[{"id":237,"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/pages\/68\/revisions\/237"}],"up":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/pages\/24"}],"wp:attachment":[{"href":"https:\/\/sites.bu.edu\/yuweifan\/wp-json\/wp\/v2\/media?parent=68"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}