Dental Biomaterials Laboratory

Specifications of major testing instruments

Name/Model: Field Emission Scanning Electron Microscope (FESEM) Hitachi SU6600
Manufacturer: Hitachi High Tech, Japan, and Oxford Instrument, UK
Resolution check report:[4/21/2015] 6.8nm at 10kV [5/13/2015] 4.6nm at 15kV.

Name/Model: Universal Testing Machine Instron 5566A
Manufacturer: Instron, Norwood, MAElectromechanical load frames are designed to apply a load to a test specimen via the moving crosshead. Software version: Bluehill 3,0
Tension, Compression, Tension Creep Relaxation, Compression Creep Relaxation, Tension Profile, Compression Profile, Peel/Tear/Friction, Flexure, Metals (Yield), Flexure Creep Relaxation

Name: Pneumatic Cyclic Loading machine (Fatigue machine)
Manufacturer: Pober Industries Co., Waban, MAPneumatically driven, 8 single unit medium (×7.86), 2 large five unit assembly (× 21.84), 2 medium five unit assembly (×7.86) and 2 X-small five unit assembly (× 1.364).
Cyclic frequency: 1Hz
Loading capacity: 40-2000N

Name/Model: Gloss meter, Novo-curve
Manufacturer: Rhopoint Instruments, UKGloss is measured by shining a known amount of light at a surface and quantifying the reflectance. The angle of the light and the method by which the reflectance is measured are determined by the surface.
Novo-Curve is designed to measure gloss index for curved surface like teeth, pens, spoons, bottles, jewelry, etc. It follows the standard of ASTM D 523 / D 2457. It may be applied to study dental materials, such as surface polishability of composite, porcelain glazing, light reflectance and etc.

Name/Model: Polishing Machine, Ecomet 250/Automet 250
Manufacturer: Buehler Ltd, Lake Bluff ILMaterials surface polishing.
Manual or automatic polishing Force 1-10 lbs [5-45N].Name/Model: Blade cutting machine, IsoMet™ 5000 Linear Precision Saw

Manufacturer: Buehler Ltd, Lake Bluff ILAutomatic section materials, plastic, resin, ceramic block, metal, tooth, etc.

Name/Model: Microhardness Tester, MicroMet™ 2003
Manufacturer: Buehler Ltd, Lake Bluff ILKnoop and Vickers hardness testing.
Indentation fracture toughness.
One indenter turret.
Two optical lenses: 40×, 10×.
Load: 10, 25, 50, 100, 200, 300, 500, 1000g.

Name/Model: Optical Microscope, IVS FSF Metallurgical

Manufacturer: LeicaBright field imaging. Dark field imaging. Polarized imaging.

CCD Camera and Video micrometer (5 micrometer res.)

Name/Model: High-temperature sintering furnace, Zircar Hotspot 110
Manufacturer: Zicar Zirconia Inc.programmable atmospheric high-temperature sintering furnace.
High-heat firing chamber (maximium:1600^oC)
Four Molybdenum Disilicide Heating Elements
Programmable controller. Hold two programs of up to 8 segments.

Name/Model: High-temperature sintering furnace, VITA® Zyrcomat T
Manufacturer: Vita VidentA programmable atmospheric high-temperature sintering furnace.
High-heat firing chamber (rated 1600^oC)
5 molybdenum elements for uniform heat distribution
Processing capabilities of 75 + plus/single/mixed unit restorations (Stacked)
Duration of the program cycle including cooling down to 400 °C for standard zirconia sintering: approx. 5 h.

Name/Model: High-temperature sintering furnace, VITA® Zyrcomat

Manufacturer: Vita VidentAtmospheric high-temperature sintering furnace with default program for sintering firing VITA In-Ceram® YZ CUBES for CEREC® .
Molybdenum disilicide elements for uniform heat distribution
230V, 1500W
Processing capabilities of 75 + plus/single/mixed unit restorations (Stacked)
Duration of the program cycle including cooling down to 200 °C for standard zirconia sintering: approx. 7.5 h.

Name/Model: Xrite Ci7600 Benchtop Spectrophotometer

Manufacturer: X-riteComputer controlled by software through USB interface. Wavenumber range 750 -360 nm, interval 10 nm. Spectrum capability. Apertures selection: Small, Medium and Large size. Illumination: Xenon flash light source, CIE D65 calibrated.
Reflectance mode and transmission mode. Export measurement data as MS Excel.
Application: Color measurement (L*a*b*);
Contrast ratio (CR); Color difference (DE*);
Transparent parameter (TP)