{"id":270,"date":"2016-08-13T13:17:32","date_gmt":"2016-08-13T17:17:32","guid":{"rendered":"https:\/\/sites.bu.edu\/tianlab\/?page_id=270"},"modified":"2026-10-20T20:01:35","modified_gmt":"2026-10-21T00:01:35","slug":"computational-phase-microscopy","status":"publish","type":"page","link":"https:\/\/sites.bu.edu\/tianlab\/publications\/computational-phase-microscopy\/","title":{"rendered":"Computational Metrology &#038; Inspection"},"content":{"rendered":"<style>article.type-post.category-research-papers > p:first-of-type em { display: inline !important; margin-right: .2em; } article.type-post.category-research-papers > p:first-of-type em:first-of-type::before { content: \"\\A\"; white-space: pre; } article.type-post.category-research-papers > p:first-of-type br + em::before, article.type-post.category-research-papers > p:first-of-type br + strong > em::before { content: none !important; } .news-posts > article.category-research-papers { margin: 0 0 30px !important; padding: 0 !important; } .news-posts > article.category-research-papers > h2 { margin: 0 0 4px !important; line-height: 1.35 !important; } .news-posts > article.category-research-papers > p { margin: 0 0 7px !important; line-height: 1.45 !important; } .news-posts > article.category-research-papers > p:has(>a:only-child) { font-size: 14px; } .news-posts > article.category-research-papers > p:has(img) { margin: 10px 0 0 !important; } .news-posts > article.category-research-papers img { display: block; margin: 0 auto !important; max-width: 100%; height: auto; } .news-posts > article.category-research-papers :is(h3,h4,h5,h6):has(img) { margin: 10px 0 0 !important; padding: 0; } .news-posts > article.category-research-papers > h2:not(.publication-title) { display: none !important; } .news-posts > article.category-research-papers > h2.publication-title { display: block !important; } .single article.category-research-papers > h2.publication-title { display: none; }article.type-post.category-research-papers > p:first-of-type :is(strong,b) em::before { content:none !important; }<\/style>\n<p class=\"publication-topics\" style=\"font-size:18px; line-height:1.6; color:#263746; background:#f3f6f8; border-left:4px solid #005a83; padding:14px 18px; margin:0 0 28px;\"><strong>Topics include:<\/strong> Computational optical metrology, surface topography, and precision measurement.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Topics include: Computational optical metrology, surface topography, and precision measurement.<\/p>\n","protected":false},"author":12228,"featured_media":1191,"parent":133,"menu_order":6,"comment_status":"closed","ping_status":"closed","template":"page-templates\/news.php","meta":[],"_links":{"self":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/270"}],"collection":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/users\/12228"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/comments?post=270"}],"version-history":[{"count":50,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/270\/revisions"}],"predecessor-version":[{"id":2961,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/270\/revisions\/2961"}],"up":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/133"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/media\/1191"}],"wp:attachment":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/media?parent=270"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}