{"id":1262,"date":"2020-02-29T18:54:25","date_gmt":"2020-02-29T23:54:25","guid":{"rendered":"https:\/\/sites.bu.edu\/tianlab\/?page_id=1262"},"modified":"2022-03-26T14:34:33","modified_gmt":"2022-03-26T18:34:33","slug":"structured-illumination-microscopy","status":"publish","type":"page","link":"https:\/\/sites.bu.edu\/tianlab\/publications\/structured-illumination-microscopy\/","title":{"rendered":"Structured Illumination Microscopy"},"content":{"rendered":"<p><strong><a href=\"https:\/\/www.osapublishing.org\/boe\/abstract.cfm?uri=boe-8-2-695\" target=\"_blank\" rel=\"noopener noreferrer\">Structured illumination microscopy with unknown patterns and a statistical prior<\/a><\/strong><br style=\"clear: both;\" \/>Li-Hao Yeh, Lei Tian, and Laura Waller<br style=\"clear: both;\" \/><em><strong>Biomed. Opt. Express<\/strong><\/em> 8, 695-711 (2017).<br style=\"clear: both;\" \/><br style=\"clear: both;\" \/><span>Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the illumination patterns, which implies a well-calibrated and aberration-free system. Here, we propose a new <\/span><i>algorithmic self-calibration<\/i><span> strategy for SIM that does not need to know the exact patterns <\/span><i>a priori<\/i><span>, but only their covariance. The algorithm, termed PE-SIMS, includes a pattern-estimation (PE) step requiring the uniformity of the sum of the illumination patterns and a SIM reconstruction procedure using a statistical prior (SIMS). Additionally, we perform a pixel reassignment process (SIMS-PR) to enhance the reconstruction quality. We achieve 2\u00d7 better resolution than a conventional widefield microscope, while remaining insensitive to aberration-induced pattern distortion and robust against parameter tuning.<\/span><\/p>\n<p><img loading=\"lazy\" src=\"\/tianlab\/files\/2017\/01\/SIM.jpeg\" alt=\"sim\" width=\"500\" height=\"436\" class=\"aligncenter wp-image-581 size-full\" \/><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Structured illumination microscopy with unknown patterns and a statistical priorLi-Hao Yeh, Lei Tian, and Laura WallerBiomed. Opt. Express 8, 695-711 (2017).Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the illumination patterns, which implies [&hellip;]<\/p>\n","protected":false},"author":12228,"featured_media":0,"parent":133,"menu_order":11,"comment_status":"closed","ping_status":"closed","template":"page-templates\/no-sidebars.php","meta":[],"_links":{"self":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/1262"}],"collection":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/users\/12228"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/comments?post=1262"}],"version-history":[{"count":4,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/1262\/revisions"}],"predecessor-version":[{"id":1845,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/1262\/revisions\/1845"}],"up":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/pages\/133"}],"wp:attachment":[{"href":"https:\/\/sites.bu.edu\/tianlab\/wp-json\/wp\/v2\/media?parent=1262"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}