{"id":33,"date":"2018-02-19T12:15:21","date_gmt":"2018-02-19T17:15:21","guid":{"rendered":"https:\/\/sites.bu.edu\/mark\/?page_id=33"},"modified":"2018-02-20T14:08:00","modified_gmt":"2018-02-20T19:08:00","slug":"research","status":"publish","type":"page","link":"https:\/\/sites.bu.edu\/mark\/research\/","title":{"rendered":"Research"},"content":{"rendered":"<p><img src=\"\/mark\/files\/2018\/02\/5-louisianatec-636x509.jpg\" alt=\"5-louisianatec\" width=\"300\" class=\"size-medium wp-image-36 alignright\" style=\"margin: 0 0px 5px 40px;\" srcset=\"https:\/\/sites.bu.edu\/mark\/files\/2018\/02\/5-louisianatec-636x509.jpg 636w, https:\/\/sites.bu.edu\/mark\/files\/2018\/02\/5-louisianatec-768x614.jpg 768w, https:\/\/sites.bu.edu\/mark\/files\/2018\/02\/5-louisianatec.jpg 900w\" sizes=\"(max-width: 636px) 100vw, 636px\" \/><\/p>\n<ul>\n<li class=\"honors_and_awards\"><strong>Areas of Interest<\/strong>\n<ol class=\"publications\">\n<li>Design of secure cryptographic devices and smart cards<\/li>\n<li>Routing in interconnection networks design and protection of cryptographic devices<\/li>\n<li>Fault-tolerant computing<\/li>\n<li>Error correcting codes<\/li>\n<li>Testing and diagnosis of computer hardware<\/li>\n<\/ol>\n<\/li>\n<\/ul>\n<ul>\n<li class=\"honors_and_awards\"><strong>Publications\u00a0<\/strong>\n<ul class=\"publications\">\n<li>View a complete list of publications<span>\u00a0<\/span><a href=\"https:\/\/scholar.google.com\/citations?hl=en&amp;user=wwweTKQAAAAJ&amp;view_op=list_works&amp;sortby=pubdate\" target=\"_blank\">chronologically by year.<\/a><\/li>\n<li>View a complete list of publications<span>\u00a0<\/span><a href=\"https:\/\/scholar.google.com\/citations?user=wwweTKQAAAAJ&amp;hl=en&amp;oi=ao\" target=\"_blank\">by citation.<\/a><\/li>\n<\/ul>\n<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Areas of Interest Design of secure cryptographic devices and smart cards Routing in interconnection networks design and protection of cryptographic devices Fault-tolerant computing Error correcting codes Testing and diagnosis of computer hardware Publications\u00a0 View a complete list of publications\u00a0chronologically by year. View a complete list of publications\u00a0by citation.<\/p>\n","protected":false},"author":9358,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/pages\/33"}],"collection":[{"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/users\/9358"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/comments?post=33"}],"version-history":[{"count":24,"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/pages\/33\/revisions"}],"predecessor-version":[{"id":90,"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/pages\/33\/revisions\/90"}],"wp:attachment":[{"href":"https:\/\/sites.bu.edu\/mark\/wp-json\/wp\/v2\/media?parent=33"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}