EC753-Lecture Notes
SC-753 Fault Tolerant Computing
Class notes are provided in Adobe Portable Document Format (PDF).
|
Lecture Topic |
FILE |
Size |
|
Fault Models and Error Models |
3705KB |
|
|
Self-error Detection/ Correction by Replication |
753-Section2 |
1191KB |
|
Interwoven Logic |
369KB |
|
|
Error Detecting Codes |
1920KB |
|
| Detection of Single Errors | 753-Section5 | 557KB |
| Two-dimension Parity Checking | 753-Section6 | 648KB |
| Correction of Single Errors | 753-Section7 | 471KB |
| Extended Hamming Codes | 753-Section8 | 937KB |
| Error Correcting Codes | 753-Section9 | 1717KB |
| Self-checking checkers | 753-Section10 | 1272KB |
| Space Time Compression of Test Responses | 753-Section11 | 2993KB |
| Detection and Correction of Errors in Linear Devices | 753-Section12 | 1597KB |
| Linear Checks (function verification) | 753-Section13 | 1939KB |
| Online Testing of Sequential Devices | 753-Section14 | 961KB |
| Error Detection for Arithmetical Devices | 753-Section15 | 2572KB |
| Testing and Diagnosis computer/ Communication Networks | 753-Section16 | 3324KB |
| Cyclic BCH Codes (Binary Case) | 753-Section17 | 1528KB |
| BCH Codes (Non-Binary Case) | 753-Section18 | 1327KB |
| Reed Solomon Codes | 753-Section19 | 464KB |
| Testing of Computer Memories | 753-Section20 | 3672KB |
| Self-testing of Gate Arrays | 753-Section21 | 1924KB |