{"id":14,"date":"2014-08-26T16:51:38","date_gmt":"2014-08-26T20:51:38","guid":{"rendered":"https:\/\/sites.bu.edu\/ludwig\/?page_id=14"},"modified":"2020-01-25T16:15:29","modified_gmt":"2020-01-25T21:15:29","slug":"research","status":"publish","type":"page","link":"https:\/\/sites.bu.edu\/ludwig\/research\/","title":{"rendered":"Research"},"content":{"rendered":"

In the last few years our primary interests have been in understanding surface and thin film growth and patterning processes using synchrotron-based x-ray scattering.\u00a0 In collaboration with Randall Headrick (University of Vermont) and Matthew Dawber (Stony Brook University), we are Partner Users on the ISR beamline 4-ID at the National Synchrotron Light Source-II (NSLS-II – Brookhaven National Laboratory).\u00a0 There we are using a custom surface diffractometer on which we have been performing real-time “non-coherent” x-ray studies of ion beam nanopatterning, in collaboration with the group of Stefan Facsko at the Helmholtz-Zentrum Dresden-Rossendorf, and epitaxial III-nitride growth by plasma-assisted atomic layer deposition, in collaboration with the group of Charles Eddy at the Naval Research Laboratory.<\/p>\n

Most recently, we have been collaborating with the Headrick group to develop the application of the coherent x-ray scattering technique of X-ray Photon Correlation Spectroscopy (XPCS) to better understand surface growth processes, utilizing the 8-ID beamline at the Advanced Photon Source (APS – Argonne National Laboratory) and the CHX\u00a0 beamline 11-ID at the NSLS-II.\u00a0 Traditional “non-coherent” x-ray scattering yields information about the average structure of a sample; therefore real-time scattering can show the “kinetics” — the change in average structure.\u00a0 In contrast, coherent scattering is sensitive to the exact structure and can thus yield information about fluctuations around the average, i.e. the underlying dynamics.<\/p>\n

\"Nitridation<\/a>
Nitridation of indium droplets to form epitaxial indium nitride nanodots on gallium nitride. AFM image (left) and cross-section TEM (right)<\/figcaption><\/figure>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

In the last few years our primary interests have been in understanding surface and thin film growth and patterning processes using synchrotron-based x-ray scattering.\u00a0 In collaboration with Randall Headrick (University of Vermont) and Matthew Dawber (Stony Brook University), we are Partner Users on the ISR beamline 4-ID at the National Synchrotron Light Source-II (NSLS-II – […]<\/p>\n","protected":false},"author":6181,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/pages\/14"}],"collection":[{"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/users\/6181"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/comments?post=14"}],"version-history":[{"count":16,"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/pages\/14\/revisions"}],"predecessor-version":[{"id":178,"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/pages\/14\/revisions\/178"}],"wp:attachment":[{"href":"https:\/\/sites.bu.edu\/ludwig\/wp-json\/wp\/v2\/media?parent=14"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}