Temperature Dependence of Secondary Electron Emission: A New Route to Nanoscale Temperature Measurement Using Scanning Electron Microscopy
M. I. Khan, S. D. Lubner, D. F. Ogletree, E. Wong, C. Dames, “Temperature Dependence of Secondary Electron Emission: A New Route to Nanoscale Temperature Measurement Using Scanning Electron Microscopy,” Journal of Applied Physics 124, 195104 (2018).